• DocumentCode
    142080
  • Title

    Special session 8C: Hot topic: Designers´ and test researchers´ roles in analog design-for-test

  • Author

    Ishida, Masahiro ; Yamaguchi, Takahiro J. ; Soma, Mani ; Fiez, Terri ; Li, Mike Peng

  • Author_Institution
    ADVANTEST Corporation
  • fYear
    2014
  • fDate
    13-17 April 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Recent analog designers do think about measurement at design time. Analog design-for-measurement is a real success, not based on test research but based on designers´ incorporation of calibration methods to ensure that their circuits work within specifications. In the meantime, mixed-signal test research has not kept pace with new design architectures, and some analog designers have outpaced mixed-signal test/design-for-test researchers. This session will elucidate the key factors for this success and the differences between design and test. And the session will discusses a designers´ and test researchers´ roles on analog design-for-test from each viewpoint, and some challenges on collaborating designers and test researchers.
  • Keywords
    Abstracts; Calibration; Design for testability; Educational institutions; Laboratories; Time measurement; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2014 IEEE 32nd
  • Conference_Location
    Napa, CA, USA
  • Type

    conf

  • DOI
    10.1109/VTS.2014.6818781
  • Filename
    6818781