DocumentCode
142080
Title
Special session 8C: Hot topic: Designers´ and test researchers´ roles in analog design-for-test
Author
Ishida, Masahiro ; Yamaguchi, Takahiro J. ; Soma, Mani ; Fiez, Terri ; Li, Mike Peng
Author_Institution
ADVANTEST Corporation
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
1
Abstract
Recent analog designers do think about measurement at design time. Analog design-for-measurement is a real success, not based on test research but based on designers´ incorporation of calibration methods to ensure that their circuits work within specifications. In the meantime, mixed-signal test research has not kept pace with new design architectures, and some analog designers have outpaced mixed-signal test/design-for-test researchers. This session will elucidate the key factors for this success and the differences between design and test. And the session will discusses a designers´ and test researchers´ roles on analog design-for-test from each viewpoint, and some challenges on collaborating designers and test researchers.
Keywords
Abstracts; Calibration; Design for testability; Educational institutions; Laboratories; Time measurement; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA, USA
Type
conf
DOI
10.1109/VTS.2014.6818781
Filename
6818781
Link To Document