Title :
Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements
Author :
Stellari, Franco ; Peilin Song ; Ainspan, Herschel A.
Author_Institution :
IBM T.J. Watson Res. Center, Yorktown Height, NY, USA
Abstract :
This paper presents a novel and powerful methodology for extracting functional blocks in hardware security and Trojan detection applications. The method is based on our proposed tester-based optical methodology that combines different test patterns, time-integrated and time-resolved emission measurements to identify and localize logic state changes and functional block activity inside a chip in a non invasive fashion. Detailed examples using a mixed-signal chip are presented and discussed to explain our proposed method.
Keywords :
copy protection; industrial property; integrated circuit design; integrated circuit testing; security of data; Trojan detection application; functional block activity; functional block extraction; hardware security detection; localize logic state changes; test pattern; tester based optical methodology; time integrated emission measurement; time resolved emission measurement; Cameras; Logic gates; Optical device fabrication; Optical imaging; Optical variables measurement; Semiconductor device measurement; Voltage-controlled oscillators; Tester-based test methodology; hardware security; reverse engineering; time-integrated and time-resolved emission;
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA
DOI :
10.1109/VTS.2014.6818792
