DocumentCode :
142105
Title :
Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology
Author :
Hsin-Chieh Chen ; Wei-Chung Chen ; Ying-Wei Chou ; Meng-Wei Chien ; Chin-Long Wey ; Ke-Horng Chen ; Ying-Hsi Lin ; Tsung-Yen Tsai ; Chao-Cheng Lee
Author_Institution :
Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2014
fDate :
15-17 Sept. 2014
Firstpage :
1
Lastpage :
4
Abstract :
Conventional constant-on-time (COT) control for DC-DC buck converter is apt to be affected by the noise caused by parasitic effect including not properly specified and temperature dependent equivalent series resistance (ESR) and equivalent series inductance (ESL). As a result, the safety operation area (SOA) of the COT is limited by the selection of external components. In this paper, the calibrated anti-ESL (CAESL) technique and the calibrated gain and BW (CGB) technique for alleviating ESL and ESR variation, respectively, are proposed to ensure a robust COT control. Furthermore, degraded output regulation caused by enlarged ESL effect due to input battery voltage variation is also solved by the CAESL technique. The proposed COT converter fabricated in 28nm CMOS technology uses an output capacitor with an ESR smaller than 1mΩ, output ripple of 20mV, and high efficiency higher than 95%. The CAESL circuit can tolerate ESL voltage variation from 0 to 50mV even when operation temperature varies from -40 to 120°C.
Keywords :
CMOS integrated circuits; DC-DC power convertors; inductance; CAESL technique; CGB technique; CMOS technology; COT control; DC-DC buck converter; SOA; anti-ESL/ESR variation; calibrated anti-ESL; calibrated gain and BW technique; constant-on-time control; equivalent series inductance; equivalent series resistance; parasitic effect; safety operation area; size 28 nm; Batteries; Calibration; Capacitors; Inductors; Semiconductor optical amplifiers; Voltage control; Voltage-controlled oscillators; calibrated anti-ESL (CAESL); calibrated gain and BW (CGB); equivalent series inductor (ESL); equivalent series resistance (ESR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/CICC.2014.6946134
Filename :
6946134
Link To Document :
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