DocumentCode :
142110
Title :
True Random Number Generator circuits based on single- and multi-phase beat frequency detection
Author :
Qianying Tang ; Bongjin Kim ; Yingjie Lao ; Parhi, Keshab ; Kim, Chul Han
Author_Institution :
Univ. of Minnesota, Minneapolis, MN, USA
fYear :
2014
fDate :
15-17 Sept. 2014
Firstpage :
1
Lastpage :
4
Abstract :
A fully-digital True Random Number Generator (TRNG) measures the frequency difference between two free-running ring oscillators, or in other words the beat frequency, to extract random frequency jitter. For generating a continuous stream of random bits with a high entropy level, the lower significant bits meeting the NIST randomness criteria are concatenated. The generation efficiency is further improved by utilizing a multi-phase structure. The proposed circuit fabricated in 65nm achieves an energy efficiency of 15.1Mb/mW at 0.8V. Experimental data collected from eight TRNG test chips passed all 15 NIST tests without the use of any feedback or tracking scheme.
Keywords :
jitter; oscillators; random number generation; TRNG; free running ring oscillators; frequency difference; multiphase beat frequency detection; random frequency jitter; single phase beat frequency detection; size 65 nm; true random number generator circuits; voltage 0.8 V; Capacitors; Delays; Frequency measurement; Generators; NIST; Noise; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/CICC.2014.6946136
Filename :
6946136
Link To Document :
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