DocumentCode
142115
Title
Hot topic session 12A: Split manufacturing — IARPA´s TIC program
Author
Collins, David ; Karri, Ramesh
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
2
Abstract
State of the art integrated circuit manufacturing is mainly centered in Asia. The US government is concerned about procuring integrated circuits from untrusted sources. In addition to the worries about counterfeiting, there is also a concern about the loss of design information which would reveal the functionality of critical circuits. IARPA´s TIC program is one approach to protecting critical program information and still obtain the performance and power advantages of state of the art circuits.
Keywords
integrated circuit manufacture; integrated circuit manufacturing; split manufacturing; Abstracts; Fabrication; Foundries; Government; Integrated circuits; Security;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA
Type
conf
DOI
10.1109/VTS.2014.6818801
Filename
6818801
Link To Document