• DocumentCode
    1421156
  • Title

    Noise and Bandwidth of 0.5-THz Twin Vertically Stacked SIS Junctions

  • Author

    Li, Jing ; Shi, Sheng-Cai ; Liu, Dong ; Zhou, Kang-Ming ; Wang, MingJye ; Chen, Tse-Jun ; Chen, Chong-Wen ; Lu, Wei-Chun ; Chiu, ChuangPing ; Chang, Hsian-Hong

  • Author_Institution
    Purple Mountain Obs., Chinese Acad. of Sci., Nanjing, China
  • Volume
    21
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    663
  • Lastpage
    666
  • Abstract
    Twin SIS (superconductor-insulator-superconductor) junctions, with a simple structure, yet large bandwidth and low noise temperature, have been widely used in millimeter- and submillimeter-wave heterodyne mixers. With increasing frequency, however, the length of the tuning inductance connecting the two individual SIS junctions becomes short while the junction area remains fixed. With a relatively short tuning inductance, the effect of the junction´s spreading inductance becomes non-negligible, and device fabrication becomes more difficult. By adopting vertically stacked SIS junctions (VSJs), which have an equivalent geometric capacitance inversely proportional to the junction number, it becomes feasible to increase the junction tuning inductance. In this paper, we report on the design, fabrication, and characterization of twin Nb/Al-AlOx/Nb/Al-AlOx/Nb VSJs for the 500-GHz frequency band.
  • Keywords
    aluminium compounds; niobium; submillimetre wave mixers; superconductor-insulator-superconductor mixers; Nb-Al-AlOx-Nb-Al-AlOx-Nb; VSJ; frequency 0.5 THz; stacked SIS junctions; submillimeter-wave heterodyne mixers; superconductor-insulator-superconductor junction; vertically stacked SIS junctions; Impedance; Inductance; Junctions; Mixers; Niobium; Noise; Tuning; Mixer noise; SIS devices (superconductor); submillimeter wave mixers; superconducting integrated circuit;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2096493
  • Filename
    5682053