Title :
Hot topic session 12B: Stay relevant with standards-based DFT
Author :
Clark, C J ; Champac, Victor
Author_Institution :
Intellitech Corp.
Abstract :
IEEE 1149.1-2013 provides compatible IEEE 1500 Wrapper Serial Port access for on-chip DFT and instrumentation access. This presentation shows how IEEE 1149.1-2013 integrates with IEEE 1500 WSPs and adds new capabilities such as wrapper segmentation for low power designs. Example architectures are presented with BSDL descriptions of IEEE 1500 WIRs and wrappers.
Keywords :
Abstracts; Bandwidth; Discrete Fourier transforms; Instruments; Random access memory; System-on-chip; Very large scale integration;
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA, USA
DOI :
10.1109/VTS.2014.6818802