DocumentCode
1421183
Title
Nonlinear Near-Field Microwave Microscope for RF Defect Localization in Superconductors
Author
Tai, Tamin ; Xi, X.X. ; Zhuang, C.G. ; Mircea, Dragos I. ; Anlage, Steven M.
Author_Institution
Phys. Dept., Univ. of Maryland, College Park, MD, USA
Volume
21
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
2615
Lastpage
2618
Abstract
Niobium-based Superconducting Radio Frequency (SRF) cavity performance is sensitive to localized defects that give rise to quenches at high accelerating gradients. In order to identify these material defects on bulk Nb surfaces at their operating frequency and temperature, it is important to develop a new kind of wide bandwidth microwave microscopy with localized and strong RF magnetic fields. By taking advantage of write head technology widely used in the magnetic recording industry, one can obtain ~ 200 mT RF magnetic fields, which is on the order of the thermodynamic critical field of Nb, on sub-micron length scales on the surface of the superconductor. We have successfully induced the nonlinear Meissner effect via this magnetic write head probe on a variety of superconductors. This design should have a high spatial resolution and is a promising candidate to find localized defects on bulk Nb surfaces and thin film coatings of interest for accelerator applications.
Keywords
Meissner effect; magnetic heads; magnetic recording; microscopes; niobium alloys; superconducting cavity resonators; RF defect localization; SRF cavity; bandwidth microwave microscopy; magnetic recording industry; nonlinear Meissner effect; nonlinear near-field microwave microscope; operating frequency; superconducting radio frequency cavity; thermodynamic critical field; write head technology; Magnetic heads; Microscopy; Niobium; Probes; Radio frequency; Superconducting magnets; Temperature measurement; Harmonic generation; RF superconductivity; magnetic write head; microwave microscope; near-field; nonlinear Meissner effect;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2010.2096531
Filename
5682057
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