DocumentCode :
1421417
Title :
InP-based cylindrical microcavity light-emitting diodes
Author :
Zhou, Weidong ; Bhattacharya, Pallab ; Qasaimeh, Omar
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
37
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
48
Lastpage :
54
Abstract :
We have investigated the properties of InP-based microcavity light-emitting diodes (λ=1.6 μm). Our objective was mainly to study the effects of lateral confinement of optical modes, which was achieved by the wet oxidation of double In0.52Al0.48 As layers. The smallest devices had a cavity radius of 0.5 μm, which becomes comparable to λ/n, where n is the effective refractive index of the photon emitting heterostructure. Two types of devices were tested: the first without any mirrors in the vertical direction, and the second with a combination of MgF/ZnSe DBR (top) and silver (bottom) to produce a low Q~35-45. The latter type of devices exhibited higher output power and narrower spectral linewidth; otherwise, the characteristics were very similar The output slope efficiency monotonically decreases with reduction of lateral cavity size up to ~2-μm in diameter and then is enhanced again for smaller cavity sizes. The slope efficiency of the smallest device (aperture diameter 1 μm) is almost equal to that measured for the largest devices. The maximum output power measured from the devices is 30 μW. The far-field pattern of devices with aperture radii ranging from 1.5 to 20 μm shows an angular width (FWHM) of 50°. On the other hand, devices with smaller aperture (radius ~0.5 μm) exhibit an angular width of 20°. The measured small-signal modulation bandwidth increases from ~0.45 GHz for the larger devices to 0.8 GHz for the smallest devices. Our results indicate that microcavity effects can be observed with only lateral photon confinement, making device fabrication requirements less stringent compared to surface-emitting lasers
Keywords :
III-V semiconductors; MOCVD; cavity resonators; indium compounds; light emitting diodes; micro-optics; mirrors; optical fabrication; optical modulation; optical resonators; oxidation; vapour phase epitaxial growth; 0.45 GHz; 0.5 mum; 0.8 GHz; 1 mum; 1.5 to 20 mum; 1.6 mum; 2 mum; 30 muW; Ag; In0.52Al0.48As; InP; InP-based cylindrical microcavity light-emitting diodes; InP-based microcavity light-emitting diodes; MgF-ZnSe; MgF/ZnSe DBR; angular width; aperture radii; cavity radius; cavity sizes; device fabrication; double In0.52Al0.48As layers; effective refractive index; far-field pattern; lateral cavity size; lateral confinement; lateral photon confinement; light-emitting diodes; maximum output power; microcavity effects; optical modes; output power; output slope efficiency; photon emitting heterostructure; slope efficiency; small-signal modulation bandwidth; spectral linewidth; surface-emitting lasers; wet oxidation; Apertures; Light emitting diodes; Microcavities; Optical refraction; Optical variables control; Oxidation; Power generation; Refractive index; Surface emitting lasers; Testing;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.892723
Filename :
892723
Link To Document :
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