Title :
Effects of conducted electromagnetic interference on analogue-to-digital converter
Author :
Wan, Fu ; Duval, Fabrice ; Savatier, X. ; Louis, Anne ; Mazari, Belahcene
Author_Institution :
IRSEEM/ESIGELEC - Technopo-le du Madrillet, France
Abstract :
The effects of conducted electromagnetic interference on an analogue-to-digital converter (ADC) are presented by the measurement. The measurement results reveal that the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a novel failure criterion for the immunity measurement of the ADC.
Keywords :
analogue-digital conversion; electromagnetic interference; failure analysis; immunity testing; ADC; DC shift behaviour; analogue-to-digital converter; conducted electromagnetic interference; continuous-wave interference; failure criterion; immunity measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.2988
