DocumentCode :
1421494
Title :
Sampling pulses with semiconductor optical amplifiers
Author :
Jiang, Leaf A. ; Ippen, Erich P. ; Feiste, Uwe ; Diez, Stefan ; Hilliger, Enno ; Schmidt, Carsten ; Weber, Hans-Georg
Author_Institution :
Res. Lab. of Electron., MIT, Cambridge, MA, USA
Volume :
37
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
118
Lastpage :
126
Abstract :
We demonstrate three techniques to measure the instantaneous frequency and intensity of optical pulses using semiconductor optical amplifiers (SOAs). Four-wave mixing, gain-saturation, and interferometric switching through a nonlinear optical loop mirror are three mechanisms by which sampling is done. We have experimentally measured the intensity and chirp profiles of pulses with energies as low as 10 fJ. Since the nonlinearity in the SOA is relatively slow, these measurement techniques are most appropriate for picosecond pulses often found in telecommunication applications. The temporal resolution of these methods are limited by timing jitter, which was ≈0.5 ps for the mode-locked laser diodes we used in our experiments, and by the width of the switching window
Keywords :
electro-optical modulation; high-speed optical techniques; laser mode locking; light interferometry; measurement by laser beam; multiwave mixing; optical saturation; semiconductor optical amplifiers; timing jitter; 0.5 ps; chirp profiles; four-wave mixing; gain-saturation; instantaneous frequency; interferometric switching; measurement techniques; mode-locked laser diodes; nonlinear optical loop mirror; nonlinearity; optical pulse intensity; picosecond pulses; sampling pulses; semiconductor optical amplifiers; switching window; telecommunication applications; temporal resolution; timing jitter; Four-wave mixing; Frequency measurement; Nonlinear optics; Optical interferometry; Optical pulses; Pulse amplifiers; Pulse measurements; Sampling methods; Semiconductor optical amplifiers; Stimulated emission;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.892733
Filename :
892733
Link To Document :
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