DocumentCode :
1421498
Title :
Discarding wide baseline mismatches with global and local transformation consistency
Author :
Zhou, H.B. ; Zhang, David Z. ; Chen, Ci ; Tian, J.W.
Author_Institution :
Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume :
47
Issue :
1
fYear :
2011
Firstpage :
25
Lastpage :
26
Abstract :
A novel method called global and local transformation consistency constraints, which combines the scale, orientation and spatial layout information of `scale invariant feature transform` (SIFT) features, is proposed for discarding mismatches from given putative point correspondences. Experiments show that the proposed method can efficiently extract high-precision matches from low-precision putative SIFT matches for wide baseline image pairs, and outperforms or performs close to state-of-the-art approaches.
Keywords :
feature extraction; image matching; transforms; SIFT; discard wide baseline mismatch; feature extraction; global transformation consistency; high-precision match; local transformation consistency; scale invariant feature transform; spatial layout information; wide baseline image pair;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2010.2967
Filename :
5682182
Link To Document :
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