• DocumentCode
    142152
  • Title

    A systematic scheme for designing RFID systems with high object detection reliability

  • Author

    Hong Cheng ; Wancheng Ni ; Na Li

  • Author_Institution
    RFID Res. Center, Inst. of Autom., Beijing, China
  • Volume
    3
  • fYear
    2014
  • fDate
    26-28 April 2014
  • Firstpage
    1521
  • Lastpage
    1526
  • Abstract
    Radio Frequency Identification (RFID) is a key technology in logistic management, object tracking, object locating, patient supervision, and many other applications. The design and deployment of the RFID system in real application is challenging due to the complexity of the factors involved. In this paper, a novel systematic scheme is proposed to provide practical guidance on the design of RFID systems with high reliability of object detection in real applications. It can be easily utilized by users. Four key parts: RFID system pre-test, RFID system deployment, RFID system reliability maintenance, and RFID error correction are included in this scheme. In each part, practical strategies which improve the object detection reliability of RFID systems are proposed. Existing strategies that enhance the reliability are also listed and discussed. The proposed strategies and existing ones are integrated seamlessly with the RFID system design in the scheme.
  • Keywords
    object detection; radiofrequency identification; telecommunication network reliability; RFID error correction; RFID system deployment; RFID system pre-test; RFID system reliability maintenance; high object detection reliability; logistic management; object location; object tracking; patient supervision; radio frequency identification; systematic scheme; Antennas; Object detection; Object recognition; Radiofrequency identification; Reliability theory; Systematics; RFID object detection reliability; RFID system design; Radio Frequency Identification; systematic scheme;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Science, Electronics and Electrical Engineering (ISEEE), 2014 International Conference on
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4799-3196-5
  • Type

    conf

  • DOI
    10.1109/InfoSEEE.2014.6946175
  • Filename
    6946175