DocumentCode :
1421975
Title :
Investigation of the Cause of a Malfunction in a Display Package and Its Solution
Author :
Kim, Jae Choon ; Lee, Dong Jin ; Sung Woo Hwang ; Ju, Byeong-Kwon ; Yun, Sang Kyeong ; Park, Heung-Woo ; Chung, Jin Taek
Author_Institution :
Package Dev. Team, Samsung Electron., Yongin, South Korea
Volume :
1
Issue :
1
fYear :
2011
Firstpage :
119
Lastpage :
124
Abstract :
A piezo-actuated display package (PADP) with deformable mirror arrays is proposed for handheld applications of a micro-beam projection display. Temperature change is a critical factor affecting the performance of a PADP. To analyze temperature-related malfunctions, electrical, mechanical, and thermal analyses of the package are conducted simultaneously. A temperature control system using a micro-heater is developed to maintain the deformable mirror module at a constant temperature. Numerical results are used to determine the relationship between displacement and the temperature of the deformable mirrors. Experimental results are used to elucidate the relationship between the source image data and the temperature of the deformable mirror module. A micro-beam projector with a temperature control system is used to produce high quality images under various ambient temperatures.
Keywords :
display devices; electronics packaging; micromirrors; optical arrays; optical projectors; temperature control; thermal analysis; PADP; deformable mirror array; display package malfunction; microbeam projection display; microheater; piezo-actuated display package; source image data; temperature control system; thermal analysis; Glass; Mirrors; Substrates; Temperature control; Temperature distribution; Temperature sensors; Deformable mirror arrays; micro-beam projector; temperature control;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2010.2099910
Filename :
5682370
Link To Document :
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