DocumentCode :
1422137
Title :
Soft-Error-Resilient FPGAs Using Built-In 2-D Hamming Product Code
Author :
Park, Sang Phill ; Lee, Dongsoo ; Roy, Kaushik
Author_Institution :
Purdue Univ., West Lafayette, IN, USA
Volume :
20
Issue :
2
fYear :
2012
Firstpage :
248
Lastpage :
256
Abstract :
Radiation-induced soft error rate (SER) degrades the reliability of static random access memory (SRAM)-based field programmable gate arrays (FPGAs). This paper presents a new built-in 2-D Hamming product code (2-D HPC) scheme to provide reliable operation of SRAM-based FPGAs in hostile operating environments such as space. Multibit error correction capability of our built-in 2-D HPC can improve the reliability, and hence, system availability, by orders of magnitude. Simulation results show that the large number of error correction capability of 2-D HPC can recover configuration bits without depending on an external memory preserving a golden copy of the configuration bits. To provide efficient 2-D HPC in a built-in logic, we also propose a new 2-D SRAM buffer. Using the proposed multibit error correction scheme, system availability of an SRAM-based FPGA can be more than 99.9999999% with SRAM cell failures in 1 billion h of operation of 7.
Keywords :
Hamming codes; SRAM chips; error correction codes; field programmable gate arrays; 2D SRAM buffer; built-in 2D Hamming product code; built-in logic; field programmable gate array reliability; multibit error correction capability; multibit error correction scheme; radiation-induced soft error rate; soft-error-resilient FPGA; static random access memory; Arrays; Error correction; Field programmable gate arrays; Hardware; Product codes; Random access memory; Reliability; Error correction coding; field programmable gate arrays; product codes; soft errors;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2095435
Filename :
5682391
Link To Document :
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