DocumentCode :
1422148
Title :
Frequency stability degradation of an oscillator slaved to a periodically interrogated atomic resonator
Author :
Santarelli, Giorgio ; Audoin, Claude ; Makdissi, Ala´a ; Laurent, Philippe ; Dick, G. John ; Clairon, André
Author_Institution :
BNM-Lab. Primaire du Temps et des Frequences, Obs. de Paris, Paris, France
Volume :
45
Issue :
4
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
887
Lastpage :
894
Abstract :
Atomic frequency standards using trapped ions or cold atoms work intrinsically in a pulsed mode. Theoretically and experimentally, this mode of operation has been shown to lead to a degradation of the frequency stability due to the frequency noise of the interrogation oscillator. In this paper a physical analysis of this effect has been made by evaluating the response of a two-level atom to the interrogation oscillator phase noise in Ramsey and multi-Rabi interrogation schemes using a standard quantum mechanical approach. This response is then used to calculate the degradation of the frequency stability of a pulsed atomic frequency standard such as an atomic fountain or an ion trap standard. Comparison is made to an experimental evaluation of this effect in the LPTF Cs fountain frequency standard, showing excellent agreement.
Keywords :
atomic clocks; frequency measurement; frequency stability; measurement standards; microwave oscillators; optical resonators; phase noise; quantum optics; trapped ions; Cs; LPTF Cs atomic fountain; Ramsey interrogation; atomic resonator; cold atom; frequency noise; frequency stability; ion trap; multi-Rabi interrogation; periodic interrogation; phase noise; pulsed atomic frequency standard; quantum mechanics; slaved oscillator; two-level atom; Atomic clocks; Degradation; Frequency; Oscillators; Phase noise; Quantum mechanics; Stability;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.710548
Filename :
710548
Link To Document :
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