DocumentCode :
1422250
Title :
Properties of the IEEE-STD-1057 four-parameter sine wave fit algorithm
Author :
Händel, Peter
Author_Institution :
Dept. of Signals, Sensors & Syst., R. Inst. of Technol., Stockholm, Sweden
Volume :
49
Issue :
6
fYear :
2000
fDate :
12/1/2000 12:00:00 AM
Firstpage :
1189
Lastpage :
1193
Abstract :
The IEEE Standard 1057 (IEEE-STD-1057) provides algorithms for fitting the parameters of a sine wave to noisy discrete time observations. The fit is obtained as an approximate minimizer of the sum of squared errors, i.e., the difference between observations and model output. The contributions of this paper include a comparison of the performance of the four-parameter algorithm in the standard with the Cramer-Rao lower bound on accuracy, and with the performance of a nonlinear least squares approach. It is shown that the algorithm of IEEE-STD-1057 provides accurate estimates for Gaussian and quantization noise. In the Gaussian scenario it provides estimates with performance close to the derived lower bound. In severe conditions with noisy data covering only a fraction of a period, however, it is shown to have inferior performance compared with a one-dimensional search of a concentrated cost function
Keywords :
Gaussian noise; IEEE standards; convergence of numerical methods; frequency estimation; least mean squares methods; measurement standards; quantisation (signal); spectral analysis; Cramer-Rao lower bound; Gaussian noise; IEEE-STD-1057; Monte Carlo simulation; approximate minimizer; concentrated cost function; convergence; electronic equipment testing; four-parameter sine wave fit algorithm; frequency estimation; grid search; measurement standards; noisy discrete time observations; nonlinear least squares approach; parameter fitting algorithm; quantization noise; sum of squared errors; Convergence; Cost function; Frequency estimation; Gaussian noise; Iterative algorithms; Least squares approximation; Least squares methods; Measurement standards; Quantization; Testing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.893254
Filename :
893254
Link To Document :
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