• DocumentCode
    1422331
  • Title

    Artificial aging and diagnostic measurements on medium-voltage, paper-insulated, lead-covered cables

  • Author

    Mladenovic, I. ; Weindl, Ch

  • Author_Institution
    Inst. of Electr. Power Syst., Erlangen, Germany
  • Volume
    28
  • Issue
    1
  • fYear
    2012
  • Firstpage
    20
  • Lastpage
    26
  • Abstract
    Present and future condition-based maintenance methods and preventive maintenance strategies will require knowledge of the present condition of the equipment. For cable networks in gen eral, and for PILC cables in particular, our understanding of the physical phenomena that occur inside cable insulation systems during operation, and their influence on the remaining service lifetime, is still fragmentary. The ICAAS system was developed primarily to facilitate an artificial aging program on MV PILC cables, based on tan δ, return voltage, and PD measurements. An extensive database was built up over a period of two years. Further results will be presented in due course. It should be noted that the ICAAS is fairly freely configu rable so that, with a little effort, it could be applied to other cable types, cable garnitures, sleeves, and terminations. It could also be used to study specific cable defects introduced during manu facture or for the general verification of production quality.
  • Keywords
    maintenance engineering; power cable insulation; ICAAS; PD measurements; PILC cables; artificial aging; cable insulation systems; condition-based maintenance methods; diagnostic measurements; lead-covered cables; preventive maintenance strategies; voltage measurement; Accelerated aging; Cable insulation; Current measurement; Investments; Partial discharges; Power cables; Temperature measurement; Voltage measurement; accelerated aging; cable diagnostics; investment strategy; medium-voltage cable; p-factor; partial discharge; remaining lifetime; returnvoltage method; tan δ;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0883-7554
  • Type

    jour

  • DOI
    10.1109/MEI.2012.6130528
  • Filename
    6130528