DocumentCode :
1422371
Title :
A new method to measure the distance between graduation lines on graduated scales
Author :
Penzes, William B. ; Allen, Richard A. ; Cresswell, Michael W. ; Linholm, Loren W. ; Teag, E. Clayton
Author_Institution :
Div. of Precision Eng., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
49
Issue :
6
fYear :
2000
fDate :
12/1/2000 12:00:00 AM
Firstpage :
1285
Lastpage :
1288
Abstract :
Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small, graduated glass scale for the calibration of optical instruments such as microscopes. However, stage micrometers are generally not calibrated, except for critical applications, due to the time and cost of optical calibration techniques. A method for calibrating line scales is presented which uses electrical test structure metrology. A description of the technique as well as examples of results from this technique are presented
Keywords :
calibration; distance measurement; instruments; measurement uncertainty; micrometry; potentiometers; distance measurement; electrical test structure metrology; graduated scales; graduation lines; line scale calibration; stage micrometer calibration; Calibration; Costs; Glass; Instruments; NIST; Optical interferometry; Optical microscopy; Substrates; Testing; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.893272
Filename :
893272
Link To Document :
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