Long term on-chip monitoring of SET pulsewidths in a fully digital ASIC

We present the design of an all-digital measurement circuit for the pulsewidth of single-event transients (SETs). It is used as an on-chip infrastructure block on a target chip that will be subjected to radiation in an experimental study. Therefore it needs to be area-efficient, robust and fast at the same time. A special feature of our proposed design is to allow recording a vector of SET pulse widths, thus avoiding the need for frequent read-out during the ongoing experiment. We prove the proper operation of our circuit by means of SET injection in a pre-layout simulation for a 90nm UMC bulk CMOS implementation.