DocumentCode :
1423035
Title :
Bounds on pseudoexhaustive test lengths
Author :
Srinivasan, Rajagopalan ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution :
Eng. Res. Center, Lucent Technol., Princeton, NJ, USA
Volume :
6
Issue :
3
fYear :
1998
Firstpage :
420
Lastpage :
431
Abstract :
Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we have derived both generic (cone-independent) and circuit-specific (cone-dependent) bounds on the minimal length of a test required so that each cone in a circuit is exhaustively tested. For any circuit with five or fewer outputs, and where each output has k or fewer inputs, we show that the circuit can always be pseudoexhaustively tested with just 2/sup k/ patterns. We derive a tight upper bound on pseudoexhaustive test length for a given circuit by utilizing the knowledge of the structure of the circuit output cones. Since our circuit-specific bound is sensitive to the ordering of the circuit inputs, we show how the bound can be improved by permuting these inputs.
Keywords :
combinational circuits; logic testing; LFSR; circuit-specific bound; combinational circuit; generic bound; pseudoexhaustive test length; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Feedback; Polynomials; Sequential analysis; Test pattern generators; Upper bound;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.711313
Filename :
711313
Link To Document :
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