• DocumentCode
    1423191
  • Title

    Synthesis for logical initializability of synchronous finite-state machines

  • Author

    Singh, Montek ; Nowick, Steven M.

  • Author_Institution
    Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
  • Volume
    8
  • Issue
    5
  • fYear
    2000
  • Firstpage
    542
  • Lastpage
    557
  • Abstract
    Logical initializability is the property of a gate-level circuit whereby it can be driven to a unique start state when simulated by a three-valued (0, 1, X) simulator. In practice, commercial logic and fault simulators often require initialization under such a three-valued simulation model. In this paper, the first sound and systematic synthesis method is proposed to ensure the logical initializability of synchronous finite-state machines. The method includes both state assignment and combinational logic synthesis steps. It is shown that a previous approach to synthesis-for-initializability, which uses a constrained state assignment method, may produce uninitializable circuits. Here, a new state assignment method is proposed that is guaranteed correct. Furthermore, it is shown that combinational logic synthesis also has a direct impact on initializability; necessary and sufficient constraints on combinational logic synthesis are proposed to guarantee that the resulting gate-level circuits are logically initializable. The above two synthesis steps have been incorporated into a computer-aided design tool, SALSIFY, targeted to both two-level and multilevel implementations.
  • Keywords
    automatic test pattern generation; design for testability; finite state machines; hazards and race conditions; logic CAD; logic simulation; multivalued logic circuits; state assignment; combinational logic synthesis; computer-aided design tool; constrained state assignment method; gate-level circuit; gate-level circuits; logical initializability; multilevel implementations; state assignment; synchronous finite-state machines; three-valued simulator; two-level implementations; unique start state; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Computational modeling; Design automation; Logic design; Logic testing;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.894160
  • Filename
    894160