DocumentCode :
1423191
Title :
Synthesis for logical initializability of synchronous finite-state machines
Author :
Singh, Montek ; Nowick, Steven M.
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
Volume :
8
Issue :
5
fYear :
2000
Firstpage :
542
Lastpage :
557
Abstract :
Logical initializability is the property of a gate-level circuit whereby it can be driven to a unique start state when simulated by a three-valued (0, 1, X) simulator. In practice, commercial logic and fault simulators often require initialization under such a three-valued simulation model. In this paper, the first sound and systematic synthesis method is proposed to ensure the logical initializability of synchronous finite-state machines. The method includes both state assignment and combinational logic synthesis steps. It is shown that a previous approach to synthesis-for-initializability, which uses a constrained state assignment method, may produce uninitializable circuits. Here, a new state assignment method is proposed that is guaranteed correct. Furthermore, it is shown that combinational logic synthesis also has a direct impact on initializability; necessary and sufficient constraints on combinational logic synthesis are proposed to guarantee that the resulting gate-level circuits are logically initializable. The above two synthesis steps have been incorporated into a computer-aided design tool, SALSIFY, targeted to both two-level and multilevel implementations.
Keywords :
automatic test pattern generation; design for testability; finite state machines; hazards and race conditions; logic CAD; logic simulation; multivalued logic circuits; state assignment; combinational logic synthesis; computer-aided design tool; constrained state assignment method; gate-level circuit; gate-level circuits; logical initializability; multilevel implementations; state assignment; synchronous finite-state machines; three-valued simulator; two-level implementations; unique start state; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Computational modeling; Design automation; Logic design; Logic testing;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.894160
Filename :
894160
Link To Document :
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