• DocumentCode
    1423227
  • Title

    Hot/cold clustering for page mapping in NAND flash memory

  • Author

    Shin, Ilhoon

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Seoul Nat. Univ. of Sci. & Technol., Seoul, South Korea
  • Volume
    57
  • Issue
    4
  • fYear
    2011
  • fDate
    11/1/2011 12:00:00 AM
  • Firstpage
    1728
  • Lastpage
    1731
  • Abstract
    NAND flash memory, which is widely used as a storage medium for mobile devices because of its lightweight, shock-resistant, silent, and energy-efficient characteristics, lacks an over-write operation. Therefore, NAND-based storage devices deploy a flash translation layer (FTL) to emulate the over-write operation with out-of-place updates. However, as out-of-place updates write data to new unwritten spaces, clean spaces eventually become scarce. This initiates a garbage collection process that accompanies several NAND writes and erases. Thus, it is important to reduce the latency and frequency of garbage collection, which is a primary aim of the present work. The central idea is to cluster hot and cold data separately to reduce the number of valid pages in a victim block at the time of garbage collection. Reducing the number of valid pages of the victim block contributes to the reduction of both the latency and frequency of the garbage collection process. Trace-driven simulations show that the proposed hot/cold clustering improves write throughput by up to 18%.
  • Keywords
    flash memories; paged storage; pattern clustering; FTL; NAND erases; NAND flash memory; NAND writes; NAND-based storage devices; cold data clustering; energy-efficient characteristics; flash translation layer; garbage collection process; hot data clustering; mobile devices; out-of-place updates; over-write operation; page mapping; shock-resistant characteristics; Distributed databases; EPROM; Educational institutions; File systems; Flash memory; Performance evaluation; Throughput; NAND flash memory.; flash translation layer; garbage collection; greedy replacement; hot/cold clustering; page mapping;
  • fLanguage
    English
  • Journal_Title
    Consumer Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-3063
  • Type

    jour

  • DOI
    10.1109/TCE.2011.6131147
  • Filename
    6131147