DocumentCode :
1423288
Title :
Constitutive parameter extraction and experimental validation of single and double negative metamaterials
Author :
Hollander, Yona ; Shavit, R.
Author_Institution :
Dept. of Electro-Opt. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
Volume :
5
Issue :
1
fYear :
2011
Firstpage :
84
Lastpage :
94
Abstract :
In this study, two independent methods to extract the constitutive parameters of large-scale (more than a wavelength long) metamaterial (MTM) structures are described. One method is based on fitting the simulated inner electric/magnetic field to the electric/magnetic field computed with an analytical model, whereas the other method is based on the scattering matrix parameters. The extraction methods are tested on three MTM structures [two single negative and one double negative (DNG)] and show results that are in good agreement. The extracted parameters were used to predict a focusing effect in a simulated spherical concave lens made of DNG MTM. The three MTM structures were experimentally measured for insertion loss in an anechoic chamber. For practical reasons, the experimental models were fabricated on Duroid substrates and scaled to operate in X-band. Detailed explanation of the construction of the MTMs and the anechoic chamber measurement setup is given. The transmission characteristics were measured at different frequencies and at different incident angles. The measured and simulated results are found to be in good agreement. In the DNG MTM, a peak transmission of -0.7 dB was measured, which to these authors- knowledge is the highest reported to date for such an MTM structure. Good transmission is maintained for incident angles of up to 45° from boresight.
Keywords :
electric fields; losses; magnetic fields; metamaterials; Duroid substrates; MTM structure; X-band; anechoic chamber measurement setup; constitutive parameter extraction; constitutive parameters; double negative metamaterials; insertion loss; metamaterial structures; scattering matrix parameters; simulated inner electric-magnetic field; simulated spherical concave lens; single negative metamaterials;
fLanguage :
English
Journal_Title :
Microwaves, Antennas & Propagation, IET
Publisher :
iet
ISSN :
1751-8725
Type :
jour
DOI :
10.1049/iet-map.2010.0024
Filename :
5685316
Link To Document :
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