DocumentCode
1423323
Title
Nonparametric Estimation of Decreasing Mean Residual Life With Type II Censored Data
Author
Shen, Yan ; Xie, Min ; Tang, Loon Ching
Author_Institution
Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Volume
59
Issue
1
fYear
2010
fDate
3/1/2010 12:00:00 AM
Firstpage
38
Lastpage
44
Abstract
In this paper, a nonparametric method is proposed for the estimation of decreasing mean residual life with type II censored data. This method is based on the comparison between two estimators of the reliability function: the Kaplan-Meier estimator, and an estimator derived from the empirical MRL function. Simulation results indicate that the new approach is able to give good performance, and can outperform some existing parametric methods when censoring is heavy.
Keywords
reliability; Kaplan-Meier estimator; mean residual life; nonparametric estimation; nonparametric method; reliability engineering; reliability function; type II censored data; Decreasing mean residual life; nonparametric estimation; type II censoring;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2010.2040772
Filename
5418920
Link To Document