DocumentCode :
1423417
Title :
Investigation on electron and hole transport properties using the full-band spherical-harmonics expansion method
Author :
Reggiani, Susanna ; Vecchi, Maria Cristina ; Rudan, Massimo
Author_Institution :
Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
Volume :
45
Issue :
9
fYear :
1998
fDate :
9/1/1998 12:00:00 AM
Firstpage :
2010
Lastpage :
2017
Abstract :
The full-band spherical-harmonics solution of the Boltzmann transport equation in silicon is achieved for both the conduction and valence band. The relevant scattering mechanisms (impact ionization, acoustic and optical phonons, ionized impurities) are modeled consistently. Comparison with Monte Carlo carrier-distribution functions at different electric fields emphasize the importance of a correct description of the band structure and scattering rates. The acoustic-phonon model is improved, the models of multiple collisions and impurity clustering, and the partial ionization of impurities are introduced. Comparison with experimental mobility data shows agreement over a wide range of temperatures and doping concentrations
Keywords :
Boltzmann equation; Monte Carlo methods; electron mobility; electron-phonon interactions; elemental semiconductors; hole mobility; impact ionisation; impurity scattering; silicon; Boltzmann transport equation; Monte Carlo carrier distribution function; Si; acoustic phonon scattering; band structure; conduction band; electric field; electron transport; full-band spherical harmonics expansion; hole transport; impact ionization; impurity clustering; ionized impurity scattering; mobility; multiple collisions; optical phonon scattering; silicon; valence band; Acoustic scattering; Boltzmann equation; Charge carrier processes; Electron optics; Impact ionization; Impurities; Optical scattering; Phonons; Semiconductor process modeling; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.711368
Filename :
711368
Link To Document :
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