• DocumentCode
    1423417
  • Title

    Investigation on electron and hole transport properties using the full-band spherical-harmonics expansion method

  • Author

    Reggiani, Susanna ; Vecchi, Maria Cristina ; Rudan, Massimo

  • Author_Institution
    Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
  • Volume
    45
  • Issue
    9
  • fYear
    1998
  • fDate
    9/1/1998 12:00:00 AM
  • Firstpage
    2010
  • Lastpage
    2017
  • Abstract
    The full-band spherical-harmonics solution of the Boltzmann transport equation in silicon is achieved for both the conduction and valence band. The relevant scattering mechanisms (impact ionization, acoustic and optical phonons, ionized impurities) are modeled consistently. Comparison with Monte Carlo carrier-distribution functions at different electric fields emphasize the importance of a correct description of the band structure and scattering rates. The acoustic-phonon model is improved, the models of multiple collisions and impurity clustering, and the partial ionization of impurities are introduced. Comparison with experimental mobility data shows agreement over a wide range of temperatures and doping concentrations
  • Keywords
    Boltzmann equation; Monte Carlo methods; electron mobility; electron-phonon interactions; elemental semiconductors; hole mobility; impact ionisation; impurity scattering; silicon; Boltzmann transport equation; Monte Carlo carrier distribution function; Si; acoustic phonon scattering; band structure; conduction band; electric field; electron transport; full-band spherical harmonics expansion; hole transport; impact ionization; impurity clustering; ionized impurity scattering; mobility; multiple collisions; optical phonon scattering; silicon; valence band; Acoustic scattering; Boltzmann equation; Charge carrier processes; Electron optics; Impact ionization; Impurities; Optical scattering; Phonons; Semiconductor process modeling; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.711368
  • Filename
    711368