• DocumentCode
    1423842
  • Title

    A 3x9 Gb/s Shared, All-Digital CDR for High-Speed, High-Density I/O

  • Author

    Loh, Matthew ; Emami-Neyestanak, Azita

  • Author_Institution
    California Inst. of Technol. (Caltech), Pasadena, CA, USA
  • Volume
    47
  • Issue
    3
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    641
  • Lastpage
    651
  • Abstract
    This paper presents a novel all-digital CDR scheme in 90 nm CMOS. Two independently adjustable clock phases are generated from a delay line calibrated to 2 UI. One clock phase is placed in the middle of the eye to recover the data (“data clock”) and the other is swept across the delay line (“search clock”). As the search clock is swept, its samples are compared against the data samples to generate eye information. This information is used to determine the best phase for data recovery. After placing the search clock at this phase, search and data functions are traded between clocks and eye monitoring repeats. By trading functions, infinite delay range is realized using only a calibrated delay line, instead of a PLL or DLL. Since each clock generates its own alignment information, mismatches in clock distribution can be tolerated. The scheme´s generalized sampling and retiming architecture is used in an efficient sharing technique that reduces the number of clocks required, saving power and area in high-density interconnect. The shared CDR is implemented using static CMOS logic in a 90 nm bulk process, occupying 0.15 mm2. It operates from 6 to 9 Gb/s, and consumes 2.5 mW/Gb/s of power at 6 Gb/s and 3.8 mW/Gb/s at 9 Gb/s.
  • Keywords
    CMOS logic circuits; calibration; clock and data recovery circuits; clock distribution networks; clocks; delay lines; integrated circuit interconnections; DLL; PLL; all-digital CDR scheme; bit rate 6 Gbit/s to 9 Gbit/s; clock distribution; clock phase; data clock; data function; data recover; delay line calibration; eye information generation; eye monitoring repeat; high-speed high-density I-O; retiming architecture; sampling architecture; search clock; size 90 nm; static CMOS logic bulk process; Calibration; Clocks; Delay; Delay lines; Hardware; Image edge detection; Pins; All-digital CDR; calibrated delay line; clock and data recovery (CDR); eye-monitor; parallel link; per-pin synchronization; shared CDR; static CMOS logic;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2011.2178557
  • Filename
    6132382