DocumentCode
1424061
Title
Sn–Cu–Ni Soldering Process Optimization Using Multivariate Analysis
Author
Huang, Chien-Yi ; Huang, Hui-Hua ; Ying, Kuo-Ching
Author_Institution
Dept. of Ind. Eng. & Manage., Nat. Taipei Univ. of Technol., Taipei, Taiwan
Volume
2
Issue
3
fYear
2012
fDate
3/1/2012 12:00:00 AM
Firstpage
527
Lastpage
535
Abstract
One lead free solder candidate, Sn-Ag-Cu305 (Sn96.5/Ag3.0/Cu0.5), has come into widespread use as a replacement for traditional tin-lead solder (Sn63/Pb37). However, the price of silver has increased dramatically in recent years. This has increased manufacturing costs, impacting firm competitiveness. This paper evaluates the performance of the low cost Sn-Cu-Ni solder alloy used for wave soldering. Sample products for several applications are used to assess critical factors in the wave soldering process. A principal component analysis was performed in this paper to integrate multiple quality characteristics, namely assembly yield and solder joint strength, for process development. As a result, a parameter combination of 270 soldering temperature and 8 s dwell time is recommended. A test vehicle with daisy-chain circuitry design is used to investigate the performance of samples prepared by the optimal process. Samples are subject to the thermal cycling test. The performance of the recommended process is therefore verified.
Keywords
principal component analysis; wave soldering; assembly yield; daisy-chain circuitry design; impacting firm competitiveness; lead free solder candidate; manufacturing cost; multivariate analysis; optimal process; principal component analysis; process development; silver; solder joint strength; soldering process optimization; temperature 270 C; test vehicle; thermal cycling test; tin-lead solder; wave soldering process; Copper; Materials; Pins; Principal component analysis; Soldering; Temperature; Lead-free solder; Sn–Cu–Ni solder; multivariate analysis; process optimization;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2011.2177093
Filename
6132413
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