DocumentCode
1424549
Title
Surface emitting semiconductor lasers
Author
Iga, Kenichi ; Koyama, Fumio ; Kinoshita, Susumu
Author_Institution
Tokyo Inst. of Technol., Yokohama, Japan
Volume
24
Issue
9
fYear
1988
Firstpage
1845
Lastpage
1855
Abstract
A description is given of the research progress in developing a vertical-cavity surface-emitting (SE) injection laser based on GaAlAs/GaAs and GaInAsP/InP systems. Ultimate laser characteristics, device design, state-of-the-art performances, possible device improvement, and future prospects will also be discussed. The authors propose a vertical-cavity surface emitting semiconductor laser. To reduce the threshold current, they improved the laser reflector and introduced a circular buried heterostructure. The microcavity structure, which is 7 mu m long and 6 mu m in diameter, was realized with a threshold of 6 mA. Thus, possibilities of an extremely low threshold current SE laser device and a densely packed two-dimensional array are suggested.<>
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; semiconductor junction lasers; 6 mA; 6 micron; 7 micron; GaAlAs-GaAs; GaInAsP-InP; III-V semiconductors; SE laser device; injection laser; laser reflector; microcavity structure; surface emitting semiconductor laser; Gallium arsenide; Indium phosphide; Microcavities; Optical arrays; Optical design; Semiconductor laser arrays; Semiconductor lasers; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.7126
Filename
7126
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