• DocumentCode
    1424549
  • Title

    Surface emitting semiconductor lasers

  • Author

    Iga, Kenichi ; Koyama, Fumio ; Kinoshita, Susumu

  • Author_Institution
    Tokyo Inst. of Technol., Yokohama, Japan
  • Volume
    24
  • Issue
    9
  • fYear
    1988
  • Firstpage
    1845
  • Lastpage
    1855
  • Abstract
    A description is given of the research progress in developing a vertical-cavity surface-emitting (SE) injection laser based on GaAlAs/GaAs and GaInAsP/InP systems. Ultimate laser characteristics, device design, state-of-the-art performances, possible device improvement, and future prospects will also be discussed. The authors propose a vertical-cavity surface emitting semiconductor laser. To reduce the threshold current, they improved the laser reflector and introduced a circular buried heterostructure. The microcavity structure, which is 7 mu m long and 6 mu m in diameter, was realized with a threshold of 6 mA. Thus, possibilities of an extremely low threshold current SE laser device and a densely packed two-dimensional array are suggested.<>
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; semiconductor junction lasers; 6 mA; 6 micron; 7 micron; GaAlAs-GaAs; GaInAsP-InP; III-V semiconductors; SE laser device; injection laser; laser reflector; microcavity structure; surface emitting semiconductor laser; Gallium arsenide; Indium phosphide; Microcavities; Optical arrays; Optical design; Semiconductor laser arrays; Semiconductor lasers; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.7126
  • Filename
    7126