Title : 
5–10 Gb/s 70 mW Burst Mode AC Coupled Receiver in 90-nm CMOS
         
        
            Author : 
Hossain, Masum ; Carusone, Anthony Chan
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
         
        
        
        
        
            fDate : 
3/1/2010 12:00:00 AM
         
        
        
        
            Abstract : 
A low power burst mode receiver architecture is presented which can be used for AC coupled links where low frequency signal components are attenuated by the channel. The nonlinear path comprises a hysteresis latch that recovers the missing low frequency content and a linear path that boosts the high frequency component by taking advantage of the high pass channel response. By optimally combining them, the front-end recovers NRZ signals up to 13 Gb/s burning only 26 mW in 90 nm CMOS. A low power- and area-efficient clock recovery scheme uses the linear path to injection lock an oscillator. A simple theory and simulation technique for ILO-based receivers is discussed. The clock recovery technique is verified with experimental results at 5-10 Gb/s in 90 nm CMOS consuming 70 mW and acquiring lock within 1.5 ns.
         
        
            Keywords : 
CMOS integrated circuits; coupled circuits; injection locked oscillators; receivers; synchronisation; CMOS; area-efficient clock recovery; attenuation; bit rate 5 Gbit/s to 10 Gbit/s; burst mode AC coupled receiver; complementary metal-oxide-semiconductor; high frequency component; high pass channel response; hysteresis latch; injection lock; low frequency signal components; low power burst mode receiver architecture; oscillator; power 26 mW; power 70 mW; size 90 nm; Clocks; Coupling circuits; Frequency; Hysteresis; Injection-locked oscillators; Integrated circuit interconnections; Optical receivers; Optical signal processing; Passive optical networks; Timing; AC coupling; Burst mode; dicode channel; half-rate; injection locking;
         
        
        
            Journal_Title : 
Solid-State Circuits, IEEE Journal of
         
        
        
        
        
            DOI : 
10.1109/JSSC.2009.2039535