Title : 
A 12 bit 50 MS/s CMOS Nyquist A/D Converter With a Fully Differential Class-AB Switched Op-Amp
         
        
            Author : 
Kim, Young-Ju ; Choi, Hee-Cheol ; Ahn, Gil-Cho ; Lee, Seung-Hoon
         
        
            Author_Institution : 
Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
         
        
        
        
        
            fDate : 
3/1/2010 12:00:00 AM
         
        
        
        
            Abstract : 
A 12 bit 50 MS/s 1.8 V pipelined CMOS analog-to-digital converter (ADC) based on a fully differential class-AB switched operational amplifier achieves low power consumption with a differential input voltage of 2.4 Vp-p. A global-loop dynamic common-mode feedback circuit enables fully differential class-AB operation with dynamic current switching for power reduction. The prototype ADC shows a peak signal-to-noise-and-distortion ratio of 64.0 dB and a peak spurious-free dynamic range of 76.6 dB for a 31 MHz input signal at 50 MS/s while the measured differential and integral nonlinearities are within ±0.26 LSB and ±0.72 LSB, respectively. The prototype ADC in a 0.18 ¿m 1P6M CMOS process consumes 18.4 mW at 50 MS/s and 1.8 V occupying an active die area of 0.26 mm2.
         
        
            Keywords : 
CMOS analogue integrated circuits; analogue-digital conversion; circuit feedback; operational amplifiers; CMOS Nyquist A-D converter; CMOS analog-to-digital converter; fully differential class-AB switched op-amp; global-loop dynamic common-mode feedback circuit; integral nonlinearities; operational amplifier; spurious-free dynamic range; Analog-digital conversion; Differential amplifiers; Dynamic range; Energy consumption; Feedback circuits; Operational amplifiers; Prototypes; Switching circuits; Switching converters; Voltage; Analog-to-digital converter (ADC); class-AB; fully differential; low power; sample-and-hold amplifier (SHA)-free; switched operational amplifier (op-amp);
         
        
        
            Journal_Title : 
Solid-State Circuits, IEEE Journal of
         
        
        
        
        
            DOI : 
10.1109/JSSC.2009.2039534