Title :
A multiple scattering reflectance model for vegetation canopy based on recollision probability
Author :
Gaoxing Chen ; Beitong Zhang ; Wenjie Fan ; Xiru Xu ; Yuan Liu ; Lu Wang
Author_Institution :
Inst. of RS & GIS, Peking Univ., Beijing, China
Abstract :
The physically-based vegetation canopy reflectance model is the basis for accurate inversion of important vegetation parameters. According the interactive process between photons and canopy, canopy reflectance could be divided into two parts: single scattering and multiple scattering reflectance. Recollision probability is a useful tool linking leaf optical properties to canopy reflectance or absorption. In this paper, based on the recollision-probability, a new and practical multiple scattering model was approached. To estimate the accuracy of this model, Monte-Carlo simulation and 3D radiosity model were used and the results showed high accuracy of this model. Then the difference between first recollision probability (p1) and multiple recollision probability(pm) was discussed. Both of p1 and pm were needed in modeling multiple scattering model. At last, the contributions of soil reflectance, leaf albedo and proportion of sky radiation to multiple scattering reflectance were discussed.
Keywords :
Monte Carlo methods; albedo; atmospheric radiation; probability; soil; vegetation; 3D radiosity model; Monte-Carlo simulation; accurate vegetation parameter inversion; canopy absorption; canopy reflectance; high model accuracy; leaf albedo; leaf optical property; model accuracy estimation; modeling multiple scattering model; multiple recollision probability; multiple scattering reflectance; multiple scattering reflectance model; photon-canopy interactive process; physically-based vegetation canopy reflectance model; practical multiple scattering model; recollision probability difference; single scattering reflectance; sky radiation proportion; soil reflectance contribution; vegetation canopy; Accuracy; Photonics; Remote sensing; Scattering; Solid modeling; Three-dimensional displays; Vegetation mapping; BRDF; Recollision probability; multiple scattering reflectance;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2014 IEEE International
Conference_Location :
Quebec City, QC
DOI :
10.1109/IGARSS.2014.6946415