DocumentCode :
1425796
Title :
New Spectral Leakage-Removing Method for Spectral Testing of Approximate Sinusoidal Signals
Author :
Wu, Minshun ; Chen, Degang ; Chen, Guican
Author_Institution :
Sch. of Electron. & Inf. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
Volume :
61
Issue :
5
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
1296
Lastpage :
1306
Abstract :
An improved fundamental identification and replacement technique is presented in this paper. The proposed method achieves fast and accurate spectral testing results for approximate sinusoidal signals without requiring coherent sampling. The new method uses data record lengths comprising only prime factors 2 or 3, which improves the computational efficiency. Furthermore, a new algorithm for counting the integer cycles in the data record is developed, which guarantees the robustness even when the signal frequency is close to Nyquist frequency and/or when noise is high. The new method provides an alternative option for testing engineers to achieve a good result in the case of noncoherent sampling without carefully choosing the windows. Theoretical analysis, simulation, and experimental results collaborate to prove the validity of the proposed method. Comparative studies demonstrate that the proposed algorithm achieves spectral testing accuracies similar to those obtained using perfect coherent sampling method. The proposed method is well qualified for high precision spectral testing.
Keywords :
data acquisition; fast Fourier transforms; integrated circuit testing; signal sampling; spectral analysis; Nyquist frequency; approximate sinusoidal signal frequency; coherent sampling method; computational efficiency; data record length; high precision spectral testing; integer cycle counting; noncoherent sampling; replacement technique; spectral leakage-removing method; Clocks; Discrete Fourier transforms; Harmonic analysis; Harmonic distortion; Noise; Robustness; Testing; Fast Fourier transform(FFT); fundamental identification and replacement technique; noncoherent sampling; spectral leakage; spectral testing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2011.2180971
Filename :
6134664
Link To Document :
بازگشت