DocumentCode :
1426013
Title :
Fault diagnosis of a distributed knockout switch
Author :
Cheng, Y.-J. ; Lee, T.-H. ; Shen, W.-Z.
Author_Institution :
Appl. Technol. Lab., Chunghwa Telecom Co. Ltd., Taoyuan, Taiwan
Volume :
145
Issue :
4
fYear :
1998
fDate :
8/1/1998 12:00:00 AM
Firstpage :
241
Lastpage :
248
Abstract :
The distributed knockout switch has multiple paths between any input and output pair and thus is inherently robust to faults without the need of adding any additional switch elements. However, to achieve fault tolerance, one has to first detect and locate the faults. The authors present an efficient fault diagnosis procedure to detect, locate, and identify the fault type of single switch element faults for the switch element array of the distributed knockout switch. To facilitate fault diagnosis, the operation of switch elements is slightly modified. The diagnosis procedure can locate most single switch element faults in two phases. Faults which cannot be located in two phases can always be located in a third phase. Binary search algorithms are developed to locate some kinds of single switch element faults in the third phase
Keywords :
asynchronous transfer mode; distributed processing; electronic equipment testing; fault diagnosis; search problems; ATM switch; binary search algorithms; distributed knockout switch; efficient fault diagnosis procedure; fault diagnosis; fault identification; fault location; fault tolerance; multiple paths; switch element array; switch elements;
fLanguage :
English
Journal_Title :
Communications, IEE Proceedings-
Publisher :
iet
ISSN :
1350-2425
Type :
jour
DOI :
10.1049/ip-com:19982136
Filename :
714379
Link To Document :
بازگشت