• DocumentCode
    1426407
  • Title

    The Shuttle Nanoelectromechanical Nonvolatile Memory

  • Author

    Pott, Vincent ; Chua, Geng Li ; Vaddi, Ramesh ; Tsai, Julius Ming-Lin ; Kim, Tony T.

  • Author_Institution
    Inst. of Microelectron. (IME), Agency for Sci., Technol. & Res. (A*STAR), Singapore, Singapore
  • Volume
    59
  • Issue
    4
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    1137
  • Lastpage
    1143
  • Abstract
    Nonvolatile memory (NVM) devices based on storage layers, p-n junctions and transistors, such as FLASH, suffer from poor retention at high temperature, high voltage writing, and wear out while cycling. This paper presents the structure, operation, and modeling of a nanoelectromechanical NVM based on the switching of a free electrode between two stable states. This electrode, called the shuttle, has no mechanical anchors and commutes between two positions. It is guided inside an insulator pod. Adhesion forces between the shuttle and fixed electrodes serve to hold the shuttle in stable positions. Smooth metal layers give strong Van der Waals stiction between two surfaces in contact. Memory detection is obtained by probing the conductance between two fixed contacts; the shuttle serves as a switchable open/short electrode. Electromechanical contacts have an ideally large resistance ratio between on and off levels. At microscale, gravity is found to be negligible compared with adhesion forces, which motivates the anchorless design for high-temperature data storage. The model proposed is based on charge induction over the surface of metal electrodes and is validated by finite-element method. Kinematic equations and energy transfers of the shuttle device are explored. Due to its unique anchorless design, the scalability of the anchorless shuttle memory is found to be excellent.
  • Keywords
    finite element analysis; integrated circuit modelling; microelectrodes; nanoelectromechanical devices; random-access storage; van der Waals forces; NVM devices; adhesion forces; charge induction; electromechanical contacts; energy transfers; finite-element method; fixed electrodes; flash memory; free electrode switching; high voltage writing; high-temperature data storage; insulator pod; kinematic equations; memory detection; metal electrode surface; p-n junctions; shuttle nanoelectromechanical nonvolatile memory; smooth metal layers; storage layers; switchable open-short electrode; transistors; van der Waals stiction; Adhesives; Electrodes; Electrostatics; Logic gates; Mathematical model; Nonvolatile memory; Switches; Electrostatic actuation; high-temperature (HT) electronics; microelectromechanical systems (MEMS); nano-electro-mechanical systems (NEMS); nonvolatile memory (NVM) devices;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2181517
  • Filename
    6135495