DocumentCode
1426407
Title
The Shuttle Nanoelectromechanical Nonvolatile Memory
Author
Pott, Vincent ; Chua, Geng Li ; Vaddi, Ramesh ; Tsai, Julius Ming-Lin ; Kim, Tony T.
Author_Institution
Inst. of Microelectron. (IME), Agency for Sci., Technol. & Res. (A*STAR), Singapore, Singapore
Volume
59
Issue
4
fYear
2012
fDate
4/1/2012 12:00:00 AM
Firstpage
1137
Lastpage
1143
Abstract
Nonvolatile memory (NVM) devices based on storage layers, p-n junctions and transistors, such as FLASH, suffer from poor retention at high temperature, high voltage writing, and wear out while cycling. This paper presents the structure, operation, and modeling of a nanoelectromechanical NVM based on the switching of a free electrode between two stable states. This electrode, called the shuttle, has no mechanical anchors and commutes between two positions. It is guided inside an insulator pod. Adhesion forces between the shuttle and fixed electrodes serve to hold the shuttle in stable positions. Smooth metal layers give strong Van der Waals stiction between two surfaces in contact. Memory detection is obtained by probing the conductance between two fixed contacts; the shuttle serves as a switchable open/short electrode. Electromechanical contacts have an ideally large resistance ratio between on and off levels. At microscale, gravity is found to be negligible compared with adhesion forces, which motivates the anchorless design for high-temperature data storage. The model proposed is based on charge induction over the surface of metal electrodes and is validated by finite-element method. Kinematic equations and energy transfers of the shuttle device are explored. Due to its unique anchorless design, the scalability of the anchorless shuttle memory is found to be excellent.
Keywords
finite element analysis; integrated circuit modelling; microelectrodes; nanoelectromechanical devices; random-access storage; van der Waals forces; NVM devices; adhesion forces; charge induction; electromechanical contacts; energy transfers; finite-element method; fixed electrodes; flash memory; free electrode switching; high voltage writing; high-temperature data storage; insulator pod; kinematic equations; memory detection; metal electrode surface; p-n junctions; shuttle nanoelectromechanical nonvolatile memory; smooth metal layers; storage layers; switchable open-short electrode; transistors; van der Waals stiction; Adhesives; Electrodes; Electrostatics; Logic gates; Mathematical model; Nonvolatile memory; Switches; Electrostatic actuation; high-temperature (HT) electronics; microelectromechanical systems (MEMS); nano-electro-mechanical systems (NEMS); nonvolatile memory (NVM) devices;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2011.2181517
Filename
6135495
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