DocumentCode :
1426417
Title :
Electrical Modeling of Carbon Nanotube Vias
Author :
Chiariello, Andrea G. ; Maffucci, Antonio ; Miano, Giovanni
Author_Institution :
Dept. of Autom., Electromagn., Inf. Eng. & Ind. Math., Univ. di Cassino, Cassino, Italy
Volume :
54
Issue :
1
fYear :
2012
Firstpage :
158
Lastpage :
166
Abstract :
This paper investigates the electrical behavior of vias made by bundles of either single-walled or multiwalled carbon nanotubes (CNTs). The electronic transport in the CNTs is modeled through the kinetic inductance, the quantum capacitance, and the electrical resistance, which depend on the equivalent number of the CNT conducting channels. The dependence of such a number on the CNT radius, chirality, and temperature is described by using the quasi-classical transport theory. Since for the common mode the effects of the intershell tunneling are negligible, the interaction between different shells is described by using the classical electromagnetic theory. A simple but accurate equivalent lumped model for vias made by CNT bundles is proposed. Vias of interest in nanoelectronic applications are here analyzed, with particular focus on the behavior of electrical parameters versus temperature and frequency.
Keywords :
carbon nanotubes; electric resistance; equivalent circuits; inductance; integrated circuit interconnections; transport processes; tunnelling; carbon nanotube via; classical electromagnetic theory; electrical modeling; electrical resistance; electronic transport; equivalent lumped model; intershell tunneling; kinetic inductance; multiwall carbon nanotubes; quantum capacitance; single wall carbon nanotubes; Computational modeling; Inductance; Integrated circuit interconnections; Kinetic theory; Quantum capacitance; Resistance; Carbon nanotubes (CNTs); conducting channels; skin effect; transmission line model; vias;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2011.2180024
Filename :
6135496
Link To Document :
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