DocumentCode :
1426506
Title :
Structural Parameter Dependence of Light Extraction Efficiency in Photonic Crystal InGaN Vertical Light-Emitting Diode Structures
Author :
Ryu, Han-Youl ; Shim, Jong-In
Author_Institution :
Dept. of Phys., Inha Univ., Incheon, South Korea
Volume :
46
Issue :
5
fYear :
2010
fDate :
5/1/2010 12:00:00 AM
Firstpage :
714
Lastpage :
720
Abstract :
Light extraction efficiency (LEE) in thin-film InGaN vertical light-emitting diode (LED) structures with photonic crystal patterns is studied using the three-dimensional finite-difference time-domain simulation. We systematically investigate the dependence of LEE on various structural parameters of photonic crystal vertical LEDs such as the thickness of the p-GaN and n-GaN layers, and air-hole depth and size. It is found that high LEE of > 80% is obtainable from unencapsulated photonic crystal LEDs for a wide range of structural parameters. In particular, higher LEE is observed for the structures with relatively long-period photonic crystal patterns and possible mechanisms for the large enhancement of LEE are discussed.
Keywords :
III-V semiconductors; finite difference time-domain analysis; gallium compounds; indium compounds; light emitting diodes; photonic crystals; InGaN; light extraction efficiency structural parameter dependence; long-period photonic crystal patterns; photonic crystal vertical light-emitting diode structures; thin-film vertical light-emitting diode; three-dimensional finite-difference time-domain simulation; Finite difference methods; Light emitting diodes; Photonic crystals; Rough surfaces; Structural engineering; Substrates; Surface roughness; Thermal conductivity; Time domain analysis; Transistors; InGaN materials; Light-emitting Diode; finite-difference time-domain (FDTD) method; light extraction efficiency; photonic crystal;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2009.2035933
Filename :
5420234
Link To Document :
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