Title :
Modelling of a pump-power-loss-controlled gain-locking system for EDFA application in WDM transmission systems
Author :
Karasek, M. ; van der Plaats, J.C.
Author_Institution :
Inst. of Radio Eng. & Electron., Acad. of Sci., Prague, Czech Republic
fDate :
8/1/1998 12:00:00 AM
Abstract :
Transient-gain amplifiers to represents a major problem in multiwavelength optical networks. To avoid error bursts in the surviving channels, signal-power fluctuations due to channel addition or removal caused by network reconfigurations or line failures must be minimised. The recently proposed and experimentally tested inversion and gain-locking technique for erbium-doped fibre amplifiers (EDFAs), based on pump power loss monitoring, is analysed. The analysis is based on the of a comprehensive large-signal model which incorporates temporal the downstream and propagation of signal, pump and spontaneous emission (ASE) in an erbium-doped fibre amplifier. It follows from the theoretical investigation that the surviving channel-power excursion in a single 20 dB gain EDFA can be reduced to 0.3 dB through the addition/removal of six channels in an eight-channel multiwavelength system when the pump-power-feedback parameters are appropriately selected
Keywords :
erbium; fibre lasers; laser feedback; optical communication equipment; optical pumping; superradiance; telecommunication network reliability; transient analysis; wavelength division multiplexing; 20 dB; ASE; EDFA application; WDM transmission systems; channel addition; channel removal; down stream signal propagation; eight-channel multiwavelength system; erbium-doped fibre amplifiers; error bursts; gain-locking technique; large-signal model; line failures; multiwavelength optical networks; network reconfigurations; pump power loss monitoring; pump-power-feedback parameters; pump-power-loss-controlled gain-locking system; signal-power fluctuations; spontaneous emission; surviving channel-power excursion; surviving channels; transient-gain amplifiers;
Journal_Title :
Optoelectronics, IEE Proceedings -
DOI :
10.1049/ip-opt:19982140