• DocumentCode
    1426712
  • Title

    A 14 b 23 MS/s 48 mW Resetting \\Sigma \\Delta ADC

  • Author

    Lee, Chun C. ; Flynn, Michael P.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    58
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1167
  • Lastpage
    1177
  • Abstract
    High-resolution, moderate-speed, calibration-free analog-to-digital converters (ADCs) are becoming increasingly difficult to design in low-voltage nanometer-scale CMOS processes. We propose an ADC architecture based on a resetting ΣΔ modulator that achieves high resolution, despite poor component matching and poor analog transistor performance. A prototype design pipelines a second-order resetting ΣΔ modulator and a 10 b cyclic ADC. The device achieves 14 b resolution and samples as a Nyquist converter at 23 MS/s. This calibration-free ADC achieves no missing codes, 87 dB SFDR and 11.7 b ENOB. The ADC is fabricated in 0.18 μm CMOS and occupies a core area of 0.5 mm2. It consumes 48 mW from a 2 V supply.
  • Keywords
    modulators; sigma-delta modulation; ADC architecture; Nyquist converter; analog transistor performance; analog-to-digital converter; component matching; low-voltage nanometer-scale CMOS process; power 48 mW; resetting sigma-delta modulator; size 0.18 mum; voltage 2 V; Capacitors; Clocks; Converters; Gain; Modulation; Noise; Pipelines; $Sigma Delta$ modulator; Analog-digital conversion; high-resolution; integrator;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2010.2097716
  • Filename
    5688204