DocumentCode :
1426980
Title :
A \\hbox {Gb/s}+ Slew-Rate/Impedance-Controlled Output Driver With Single-Cycle Compensation Time
Author :
Kwak, Young-Ho ; Jung, Inhwa ; Kim, Chulwoo
Author_Institution :
Korea Univ., Seoul, South Korea
Volume :
57
Issue :
2
fYear :
2010
Firstpage :
120
Lastpage :
125
Abstract :
This brief introduces a low-noise slew-rate/impedance-controlled high-speed output driver in 0.18-¿m CMOS process. The output driver adopts an open-loop structure that enables the system to take only a single cycle to control the signal slew-rate or driver impedance. The control blocks consume 4.907 mA at 1 Gb/s. The proposed output driver is designed to maintain the data slew rate in the range of 2.1-3.6 V/ns. The proposed scheme is also applied to a pseudo-open-drain output driver, and the maximum and minimum variations of the impedance are +1.78% and -1.30%, respectively.
Keywords :
CMOS integrated circuits; compensation; driver circuits; open loop systems; CMOS process; bit rate 1 Gbit/s; current 4.907 mA; high-speed output driver; impedance controlled output driver; low-noise slew-rate driver; open loop structure; pseudoopen-drain output driver; single-cycle compensation time; size 0.18 mum; Circuit noise; Circuit testing; Crosstalk; Driver circuits; Impedance; Open loop systems; Phase locked loops; Semiconductor device noise; Signal generators; Temperature; Electromagnetic interference (EMI); fast compensation; low power; process, voltage, and temperature (PVT) variation detection; slew rate;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2009.2038631
Filename :
5420307
Link To Document :
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