Optical interconnection using VCSELs and polymeric waveguide circuits

Author

Sakamoto, Takashi ; Tsuda, Hiroyuki ; Hikita, Makoto ; Kagawa, Toshiaki ; Tateno, Kouta ; Amano, Chikara

Author_Institution

NTT Photonics Lab., Kanagawa, Japan

Volume

18

Issue

11

fYear

2000

Firstpage

1487

Lastpage

1492

Abstract

We investigated the waveguide loss and transmission characteristics for optical interconnection using vertical-cavity surface-emitting lasers (VCSELs) and multimode polymeric waveguide circuits with crossings. The excess loss with 100 crossings is 2.2 dB when the image magnification from a VCSEL to a waveguide is 2.3. We obtained error-free (i.e., bit error rate <10/sup -11/) optical interconnection at 1.0625 Gbps regardless of the number of crossings or the magnification. These results suggest the practicality of large-scale optical interconnection between VCSEL-based smart-pixel chips using multimode waveguides with more than 100 crossings.

Keywords

integrated optoelectronics; optical interconnections; optical waveguides; semiconductor lasers; smart pixels; surface emitting lasers; VCSEL-based smart-pixel chips; VCSELs; bit error rate; image magnification; large-scale optical interconnection; multimode polymeric waveguide circuits; multimode waveguides; optical interconnection; polymeric waveguide circuits; transmission characteristics; vertical-cavity surface-emitting lasers; waveguide loss; Optical interconnections; Optical losses; Optical polymers; Optical surface waves; Optical waveguides; Propagation losses; Surface emitting lasers; Surface waves; Vertical cavity surface emitting lasers; Waveguide lasers;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.896208

Filename

896208