Title :
Architecture, design, and test of continuous-time tunable intermediate-frequency bandpass delta-sigma modulators
Author :
Raghavan, Gopal ; Jensen, J.F. ; Laskowski, J. ; Kardos, M. ; Case, Michael G. ; Sokolich, M. ; Thomas, Stephen, III
Author_Institution :
HRL Labs., Malibu, CA, USA
fDate :
1/1/2001 12:00:00 AM
Abstract :
This paper examines the architecture, design, and test of continuous-time tunable intermediate-frequency (IF) fourth-order bandpass delta-sigma (BP ΔΣ) modulators. Bandpass modulators sampling at high IFs (~100 MHz) allow direct sampling of the RF signal-reducing analog hardware and make it easier to realize completely software programmable receivers. This paper presents circuit design of and test results from continuous-time fourth-order BP ΔΣ modulators fabricated in AlInAs/GaInAs heterojunction bipolar technology with a peak unity current gain cutoff frequency (fT) of 80 GHz and a maximum frequency of oscillation (fMAX) of about 130 GHz. Operating from ±5-V power supplies, a fabricated 180-MHz IF fourth-order ΔΣ modulator sampling at 4 GS/s demonstrates stable behavior and achieves 75.8 dB of signal-to-(noise+distortion)-ratio (SNDR) over a 1-MHz bandwidth. Narrowband performance (~1 MHz) performance of these modulators is limited by thermal/device noise while broadband performance (~60 MHz), is limited by quantization noise. The high sampling frequency (4 GS/s) in this converter is dictated by broadband (60 MHz) performance requirements
Keywords :
III-V semiconductors; aluminium compounds; bipolar integrated circuits; circuit tuning; continuous time systems; delta-sigma modulation; gallium arsenide; indium compounds; integrated circuit noise; thermal noise; 1 MHz; 130 GHz; 180 to 200 MHz; 60 MHz; 80 GHz; AlInAs-GaInAs; bandpass delta-sigma modulators; completely software programmable receivers; continuous-time tunable intermediate-frequency circuits; direct sampling; heterojunction bipolar technology; narrowband performance; peak unity current gain cutoff frequency; quantization noise; sampling frequency; signal-to-(noise+distortion)-ratio; thermal/device noise; Circuit testing; Computer architecture; Cutoff frequency; Delta modulation; Hardware; Modulation coding; RF signals; Radio frequency; Sampling methods; Tunable circuits and devices;
Journal_Title :
Solid-State Circuits, IEEE Journal of