DocumentCode :
1427713
Title :
Domain Transfer Multiple Kernel Learning
Author :
Duan, Lixin ; Tsang, Ivor W. ; Xu, Dong
Author_Institution :
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume :
34
Issue :
3
fYear :
2012
fDate :
3/1/2012 12:00:00 AM
Firstpage :
465
Lastpage :
479
Abstract :
Cross-domain learning methods have shown promising results by leveraging labeled patterns from the auxiliary domain to learn a robust classifier for the target domain which has only a limited number of labeled samples. To cope with the considerable change between feature distributions of different domains, we propose a new cross-domain kernel learning framework into which many existing kernel methods can be readily incorporated. Our framework, referred to as Domain Transfer Multiple Kernel Learning (DTMKL), simultaneously learns a kernel function and a robust classifier by minimizing both the structural risk functional and the distribution mismatch between the labeled and unlabeled samples from the auxiliary and target domains. Under the DTMKL framework, we also propose two novel methods by using SVM and prelearned classifiers, respectively. Comprehensive experiments on three domain adaptation data sets (i.e., TRECVID, 20 Newsgroups, and email spam data sets) demonstrate that DTMKL-based methods outperform existing cross-domain learning and multiple kernel learning methods.
Keywords :
learning (artificial intelligence); minimisation; pattern classification; support vector machines; DTMKL framework; SVM; cross-domain kernel learning framework; distribution mismatch minimization; domain transfer multiple kernel learning; feature distributions; kernel function; labeled patterns; prelearned classifiers; robust classifier learning; structural risk functional minimization; Kernel; Learning systems; Optimization; Support vector machines; Training; Training data; Vectors; Cross-domain learning; domain adaptation; multiple kernel learning.; support vector machine; transfer learning;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2011.114
Filename :
6136518
Link To Document :
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