• DocumentCode
    1427837
  • Title

    Daily scheduling for R&D semiconductor fabrication

  • Author

    Liao, Da Yin ; Chang, Shi Chung ; Pei, Kuo Wei ; Chang, Chi Ming

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    9
  • Issue
    4
  • fYear
    1996
  • fDate
    11/1/1996 12:00:00 AM
  • Firstpage
    550
  • Lastpage
    561
  • Abstract
    This paper presents the development of a daily scheduling tool, Electronic Research and Service Organization Fab Scheduler (ERSOFS), for a research and development (R&D) pilot line of semiconductor wafer fabrication. An integer programming problem formulation is first given, which captures the salient features such as high variety and very low volume, cyclic process flows, batching at diffusion machines, single mask for each photolithography operation, loop test and engineering splitting and merging of wafer lots. A solution methodology based on Chang and Liao´s approach [1994] for scheduling flexible flow shops is then extended to this class of problems. The solution methodology is implemented and validated in an R&D fab. Results indicate that ERSOFS efficiently generates schedules of high quality. The rescheduling function of ERSOFS provides fast and smooth adjustments of schedules to cope with the. high production uncertainties in an R&D fab. Analysis of the algorithmic properties demonstrates the potential of ERSOFS for application to larger fabs
  • Keywords
    batch processing (industrial); flexible manufacturing systems; integer programming; integrated circuit manufacture; merging; photolithography; production control; research and development management; ERSOFS; R&D semiconductor fabrication; batching; cyclic process flows; daily scheduling; diffusion machines; fab scheduler; flexible flow shops; integer programming problem formulation; loop test; merging; photolithography; pilot line; production uncertainties; rescheduling function; semiconductor wafer fabrication; wafer lots; Algorithm design and analysis; Fabrication; Job shop scheduling; Linear programming; Lithography; Merging; Production; Research and development; Testing; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.542170
  • Filename
    542170