Title :
A Sensitivity Analysis Method for Equivalent Parameter Extraction of Transient Magnetic Field With Internal Circuits
Author :
Ho, S.L. ; Niu, Shuangxia ; Fu, W.N. ; Zhu, JianGuo
Author_Institution :
Dept. of Electr. Eng., Hong Kong Polytech. Univ., Hong Kong, China
Abstract :
A sensitivity analysis method for the equivalent parameter extraction of transient magnetic field problems with internally coupled circuits is presented. In contrast to conventional methods using physical meaning and physical relationships for parameter extraction, this method is based on a collection of mathematical system equations which include transient magnetic field equations and internal circuit equations. The extracted parameters include the collective effects of eddy currents, internal circuits, and mechanical motion. Compared with previous sensitivity analysis methods which extract only the equivalent inductance, the proposed algorithm extracts also the equivalent resistance. A laminated transformer with internal circuit is reported to validate and showcase the proposed method.
Keywords :
eddy currents; finite element analysis; inductance; laminations; parameter estimation; sensitivity analysis; transformers; collective effects; eddy currents; equivalent inductance; equivalent parameter extraction; equivalent resistance; finite-element method; internally coupled circuits; laminated transformer; mathematical system equations; mechanical motion; parameter extraction; sensitivity analysis method; transient magnetic field equations; transient magnetic field problems; Couplings; Equations; Magnetic circuits; Mathematical model; Resistance; Transient analysis; Windings; Electric circuit; equivalent parameter; finite-element method; indirect coupling; sensitivity; transient magnetic field;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2011.2173912