Title :
Simple, accurate method for characterising two-port devices with small reflections
Author_Institution :
Dept. of Phys., Tromso Univ., Norway
fDate :
9/3/1998 12:00:00 AM
Abstract :
A simple yet accurate method for characterising a two-port device with small reflections using a network analyser is presented. The method only requires two measurements, corresponding to through and device connections, to remove the influence of systematic errors on the transmission parameters of the device. Experimental results support the method
Keywords :
S-parameters; measurement errors; measurement theory; microwave measurement; network analysers; network analyser; reflections; transmission parameters; two-port devices;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981267
