DocumentCode
1427998
Title
Simple, accurate method for characterising two-port devices with small reflections
Author
Wan, Changhua
Author_Institution
Dept. of Phys., Tromso Univ., Norway
Volume
34
Issue
18
fYear
1998
fDate
9/3/1998 12:00:00 AM
Firstpage
1761
Lastpage
1763
Abstract
A simple yet accurate method for characterising a two-port device with small reflections using a network analyser is presented. The method only requires two measurements, corresponding to through and device connections, to remove the influence of systematic errors on the transmission parameters of the device. Experimental results support the method
Keywords
S-parameters; measurement errors; measurement theory; microwave measurement; network analysers; network analyser; reflections; transmission parameters; two-port devices;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981267
Filename
715373
Link To Document