DocumentCode :
1428162
Title :
3-D Finite Element Modeling and Validation of Power Frequency Multishielding Effect
Author :
Cheng, Z. ; Takahashi, N. ; Forghani, B. ; Liu, L. ; Fan, Y. ; Liu, T. ; Zhang, J. ; Wang, X.
Author_Institution :
R & D Center, Tianwei Group Co. Ltd., Baoding, China
Volume :
48
Issue :
2
fYear :
2012
Firstpage :
243
Lastpage :
246
Abstract :
The electromagnetic (EM) barrier, the magnetic (M) shunt and a combination of both are widely used in electrical devices in order to control stray fields and effectively reduce the power loss that may lead to hazardous local overheating. This paper focuses on the 3-D finite element modeling and validation of multishielding at power frequencies. The hybrid (M+EM) shielding behavior of the current magnetic shunt configuration is numerically and experimentally examined and is compared to other types. The leakage flux complementary-based measurement method of stray-field loss is also proposed and verified based on the benchmark shielding models.
Keywords :
electromagnetic devices; electromagnetic shielding; finite element analysis; 3D finite element modeling; electromagnetic barrier; hybrid shielding; magnetic shunt; power frequency multishielding effect; Iron; Loss measurement; Magnetic noise; Magnetic shielding; Power transformers; Steel; FE modeling; leakage flux complementary; multishielding effect; power frequency shield; stray-field loss;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2011.2172580
Filename :
6136608
Link To Document :
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