DocumentCode
1428251
Title
DCS Tx filters using AlN resonators with iridium electrodes
Author
Clement, Marta ; Iborra, Enrique ; Olivares, Jimena ; Rimmer, Nick ; Giraud, Sylvain ; Bila, Stéphane ; Reinhardt, Alexandre
Author_Institution
Grupo de Microsistemas y Mater. Electronicos (GMME), Univ. Politec. de Madrid (UPM), Madrid, Spain
Volume
57
Issue
3
fYear
2010
fDate
3/1/2010 12:00:00 AM
Firstpage
518
Lastpage
523
Abstract
In this paper we present the design, fabrication technology, and characterization of BAW filters for the Digital Cellular System (DCS) Tx-band at 1.75 GHz. The filters are fabricated with AlN-based solidly mounted resonators (SMR) using iridium electrodes, in an attempt to increase the effective electromechanical coupling factor of the BAW devices and achieve the bandwidth requirements of DCS filters. The design and optimization of the filters is performed with a simulation tool that uses a circuit model to compute the filter frequency response. Tx filters with balanced inputs and outputs and different topologies are designed and fabricated. The experimental filter response is compared with the simulations to determine the suitability of each design. DCS bandwidth requirements are fulfilled by using Ir/AlN/Ir stacks.
Keywords
III-V semiconductors; UHF filters; acoustic resonator filters; aluminium compounds; band-pass filters; bulk acoustic wave devices; electrodes; electromechanical effects; iridium; metal-semiconductor-metal structures; wide band gap semiconductors; BAW devices; BAW filters; DCS Tx filters; Ir-AlN-Ir; band-pass filters; circuit model; digital cellular system; electromechanical coupling factor; frequency 1.75 GHz; frequency response; iridium electrodes; solidly mounted resonators; Bandwidth; Bulk acoustic wave devices; Circuit simulation; Computational modeling; Coupling circuits; Digital filters; Distributed control; Electrodes; Fabrication; Resonator filters;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2010.1442
Filename
5422490
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