DocumentCode :
1428268
Title :
The Allan Variance - challenges and opportunities
Author :
Stein, Samuel R.
Author_Institution :
Symmetricom, Inc., Boulder, CO, USA
Volume :
57
Issue :
3
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
540
Lastpage :
547
Abstract :
The Allan variance has historically been estimated using heterodyne measurement systems, which have low noise and preserve the carrier phase information needed for long-term stability. The single-sideband phase noise has traditionally been estimated using phase detectors that suppress the carrier to achieve even lower noise. The recent development of the direct-digital phase noise measurement technique makes it possible to estimate both statistics accurately and simultaneously from the same time series of the phase. Our comparison of the 3 techniques has revealed several challenges to the accurate estimation of the Allan variance including undesired aliasing, biased estimators, and spurious signal generation. Investigation of these difficulties has led to several opportunities to improve Allan variance estimation, including the ability to estimate the instrumentation noise floor during a measurement and the existence of an optimum measurement bandwidth. In the end, this has led to faster, easier, more reliable, and more accurate measurement methods.
Keywords :
electric noise measurement; oscillators; phase noise; time series; Allan variance estimation; biased estimators; direct-digital phase noise measurement; heterodyne measurement systems; instrumentation noise floor; optimum measurement bandwidth; single-sideband phase noise; spurious signal generation; statistics; time series; Detectors; Measurement techniques; Noise measurement; Phase detection; Phase estimation; Phase measurement; Phase noise; Signal generators; Stability; Statistics;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2010.1445
Filename :
5422493
Link To Document :
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