DocumentCode :
1428340
Title :
A fatigue-free silicon device structure
Author :
Green, W. B.
Author_Institution :
Westinghouse Electric Corporation, Youngwood, Pa.
Volume :
80
Issue :
6
fYear :
1961
fDate :
6/1/1961 12:00:00 AM
Firstpage :
438
Lastpage :
438
Abstract :
GERMANIUM DEVICES, when correctly used, are capable of essentially infinite life. It was commonly assumed in early higher temperature semiconductor work that silicon devices and those of other materials — such as SiC and the III-V compounds — would have similar life expectancy. However, among the early silicon applications, a number of installations were encountered where unusually high failure rates were recorded. A common feature of these installations was that there were present a large number of “off-on” operations each day.
Keywords :
Copper; Fatigue; Junctions; Silicon; Silicon devices; Strain; Thermal resistance;
fLanguage :
English
Journal_Title :
Electrical Engineering
Publisher :
ieee
ISSN :
0095-9197
Type :
jour
DOI :
10.1109/EE.1961.6433294
Filename :
6433294
Link To Document :
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